CT4076-NA
- Mfr.Part #
- CT4076-NA
- Manufacturer
- Cal Test Electronics
- Package/Case
- -
- Datasheet
- Download
- Description
- Test Probes DIFFERENCIAL PROBE 35MHZ 100X/1000X NA
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- Manufacturer :
- Cal Test Electronics
- Product Category :
- Test Probes
- Bandwidth :
- 35 MHz
- Current Rating :
- 200 mA
- Equipment Type :
- Differential Probes
- Length :
- 220 mm
- Type :
- Differential Probe
- Datasheets
- CT4076-NA
Manufacturer related products
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Cal Test ElectronicsAttenuators - Interconnects SMA (male to female) attenuator, 18 GHz, 50 O, -10 dB Attenuation -
Cal Test ElectronicsAttenuators - Interconnects SMA (male to female) attenuator, 18 GHz, 50 O, -20 dB Attenuation
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Cal Test ElectronicsAttenuators - Interconnects SMA (male to female) attenuator, 18 GHz, 50 O, -3 dB Attenuation
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Cal Test ElectronicsAttenuators - Interconnects SMA (male to female) attenuator, 18 GHz, 50 O, -30 dB Attenuation
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Cal Test ElectronicsAttenuators - Interconnects SMA (male to female) attenuator, 18 GHz, 50 O, -6 dB Attenuation
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